Equipment Filter

The AFM CP-II probes the surface of a material with a sharp tip, which is a few microns long and less than 10nm in diameter.

Institution:

Walter Sisulu University

Microscope›Atomic Force Microscope (AFM)

AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.

Institution:

University of the Witwatersrand

Microscope›Atomic Force Microscope (AFM)

Locations

Agricultural Research Council	North West University	University of Johannesburg
Cape Penninsula University of Technology	Oceanographic Research Institute	University of KwaZulu-Natal
Central University of Technology	Rhodes University	University of Limpopo
Centre for Proteomics and Genomics Research	Sefako Makgato Health Sciences University	University of Pretoria
Council for Scientific and Industrial Research (CSIR)	South African Astronomical Observatory	University of South Africa
Durban University of Technology	South African Environmental Observation Network (SAEON)	University of the Free State
Hartebeesthoek Radio Astronomy Observatory (HartRAO)	South African Institute for Aquatic Biodiversity (SAIAB)	University of the Western Cape
iThemba LABS	South African National Space Agency (SANSA)	University of the Witwatersrand
Mintek	South African Nuclear Energy Corporation (NECSA)	University of Venda
National Institute for Communicable Diseases	Stellenbosch University	University of Zululand
National Museum	Tshwane University of Technology	Vaal University of Technology
National Zoological Gardens	University of Cape Town	Walter Sisulu University
Nelson Mandela Metropolitan University	University of Fort Hare