Equipment Filter

Jeol JSM 7900F FE-SEM

The field emission scanning electron microscope (FE-SEM) is an ultra-high-resolution materials characterization equipment that can be used for effe

Institution:

University of Johannesburg

Microscope

Show me

Locations

Agricultural Research Council	North West University	University of Johannesburg
Cape Penninsula University of Technology	Oceanographic Research Institute	University of KwaZulu-Natal
Central University of Technology	Rhodes University	University of Limpopo
Centre for Proteomics and Genomics Research	Sefako Makgato Health Sciences University	University of Pretoria
Council for Scientific and Industrial Research (CSIR)	South African Astronomical Observatory	University of South Africa
Durban University of Technology	South African Environmental Observation Network (SAEON)	University of the Free State
Hartebeesthoek Radio Astronomy Observatory (HartRAO)	South African Institute for Aquatic Biodiversity (SAIAB)	University of the Western Cape
iThemba LABS	South African National Space Agency (SANSA)	University of the Witwatersrand
Mintek	South African Nuclear Energy Corporation (NECSA)	University of Venda
National Institute for Communicable Diseases	Stellenbosch University	University of Zululand
National Museum	Tshwane University of Technology	Vaal University of Technology
National Zoological Gardens	University of Cape Town	Walter Sisulu University
Nelson Mandela Metropolitan University	University of Fort Hare

HTTP/1.1 200 OK Date: Sat, 01 Jun 2024 19:28:39 GMT Server: Apache/2.4.7 (Ubuntu) X-Powered-By: PHP/5.5.9-1ubuntu4.24 Expires: Sun, 19 Nov 1978 05:00:00 GMT Cache-Control: no-cache, must-revalidate X-Content-Type-Options: nosniff Content-Language: en X-Frame-Options: SAMEORIGIN Permissions-Policy: interest-cohort=() X-Generator: Drupal 7 (http://drupal.org) Link: ; rel="canonical",; rel="shortlink" Content-Type: text/html; charset=utf-8

You are here

Equipment Filter

Jeol JSM 7900F FE-SEM

Locations