Equipment Filter
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Institution:
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
Field Emission Gun Scanning Electron Microscope (FEG-SEM) QEMSCAN Electron Microscopes
Automated mineralogy is an analytical tool which provides rapid, reproducible and statistically reliable quantitative information on minerals and c
Institution:
University of Cape Town
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)