Equipment Filter
Bruker D8 Venture Diffractometer System with CMOS Photon 100 Detector and Silver and Molybdenum Sources X-ray Diffractometer (XRD)
Dual wavelength system with silver (Ag) and molybdenum (Mo) radiation:
Institution:
University of the Witwatersrand
Diffractometers›X-ray Diffractometer (XRD)
Veeco Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)
AFM measures the atomic level forces between a sharp probing tip attached to a cantilever spring and a sample surface.
Institution:
University of the Witwatersrand
Microscope›Atomic Force Microscope (AFM)