Equipment Filter
FEI Nova 600 NanoLab Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Electron Microscopes
The FIB-SEM is an ultra high resolution, analytical Field Emission Gun Scanning Electron Microscope (FEG-SEM) that is used to study surface structu
Institution:
University of the Witwatersrand
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)›Focussed Ion-Beam SEM (FIB-SEM)
FEI Helix Detector (HD) Gaseous Analytical Detector (GAD) and Electron Backscatter Diffraction Detector (EBDD)
The equipment consists of additional detectors for the Nova NanoSEM: Helix Detector.
Institution:
Mintek
Detectors
NETZSCH GmbH Rhodium Furnace with Calorimetry Module for Simultaneous Thermal Analyser (STA) - Rhodium furnace Model 6.225.6-89
The Simultaneous Thermal Analysis system has a high temperature furnace capability of up to 1650o
Institution:
Mintek
Thermal analysis system