Equipment Filter
Carl Zeiss Superresolution ELYRA S1 with SR-SIM and LSM 780 technology
The Supperresolution ELYRA S1 utilizes SR-SIM (Super resolution Structured Illumination Microscopy) technology to yield resolution of up to double
Institution:
Stellenbosch University
Microscope
Jeol JEM 1200EXII Electron Microscopes
A JEOL JEM 1200 EXII allows users to perform conventional TEM with thin-sectioned specimens, X-ray microanalysis, and other transmission electron m
Institution:
Stellenbosch University
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)