Equipment Filter
Jeol JSM 7500F Scanning Electron Microscope
The JSM-7500F is an analytical Field Emission
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope
Jeol JEM 2100 Transmission Electron Microscope Electron Microscopes
The JEM-2100 Electron Microscope provides solutions for a wide range of problems in the fields of nanoelectronics, materials, and biological scienc
Institution:
Council for Scientific and Industrial Research (CSIR)
Microscope›Electron Microscopes›Transmission Electron Microscope (TEM)