Equipment Filter
Jeol JSM 639OLV Scanning Electron Microscope (SEM) and Noran Six 200 Energy Dispersive X-ray (EDX) Analyzer Electron Microscopes
The JSM-6390LV is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm.
Institution:
University of Fort Hare
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)