Cascade Microtech PM300 Analytical Probe System
The PM300 probe system is the ideal solution for engineering tests of 300 mm wafers and substrates. Irrespective of the application, the versatility of the PM300 meets requirement from failure analysis (FA) to device and wafer characterization (DWC) to wafer-level reliability (WLR) testing and ensures the highest possible degree of precision. Testing flat panel displays is enabled by using the optional square chuck.