300 mm/12 inch

300 mm/12 inch Wafer Probing Station for mm-Wave applications

A wafer is a thin slice of semiconductor material, such as a silicon crystal, used in the fabrication or prototyping of integrated circuits (ICs) and other micro devices. A wafer probing station is the simplest and most direct method of testing un-encapsulated die (a portion/chip of a wafer).
Wafer probing is required if:

Contact Person/s

Name: Prof Saurabh Sinha
Phone: +27 12-420-2950
Email: ssinha@ieee.org

Grantholder

Title: Prof
First Name: Saurabh
Last Name: Sinha
Phone: +27 12-420-2950
Email: ssinha@ieee.org
300 mm/12 inch Wafer Probing Station for mm-Wave applications