Multi-Functional Advanced Optical Characterisation Facility for Materials/Nano-Systems
This multi-functional platform which would be the first of its kind nationwide is unique and exclusive in terms of integration and versatility. It consists of the following complementary components:
(i) UV-VIS-NIR spectroscopy unit (200-300nm, T and R modes + Heating stage)
(ii) Integrating sphere unit (200-400nm)
(iii) Ellipsometry unit (300-1000nm + software)
(iv) Optical-reflectometry unit (250-1050nm) for thin films thickness measurements (10nm-100nm)
(v) LIBS unit (190-800nm,Res.˂0.1 nm)
(vi) Fluorescence unit (200-295nm, Xe lamp)