Micron Semiconductor Coincident Segmented Ancillary Detector System for the K600 Magnetic Spectrometer

Model: 
Coincident Segmented Ancillary Detector System for the K600 Magnetic Spectrometer
Manufacturer: 
Micron Semiconductor Coincident Segmented Ancillary Detector System for the K600 Magnetic Spectrometer
  • S2-1500 (DS) Silicon detectors (48 rings, 16 sectors)
  • HYBALL TIARA MMM Silicon detectors (16 strips, 8 sectors)
  • STM-16 Spectroscopy amplifiers (16 channels per amplifier)
  • V785 12bit peak sensing ADC's (32 channels per ADC)
  • BCF10 scintillating fibres, 1.5mm diameter: 1200mm x 110mm
  • BC408 scintillators, 1.5mm thick: 1200mm x 110mm
  • photomultiplier tubes R329-02
  • photomultiplier tube bases E5859
  • scattering chamber

The ancillary detector system proposed for the K600 Magnetic Spectrometer will consists of dedicated segmented double sided Si detectors (including signal amplification and digitization electronics) placed in an scattering chamber that is designed to mimimize multiple scattering prior to detection. This will enable coincident measurements of particle-decay during high energyresolution studies at very small scattering angles, including 0 degrees. In addition an upgraded suite of scintillator detectors in the K600 focal plane will enable the clean detection of low energy scattered particles in the magnetic spectrometer.

Status: 
Available
Condition: 
New
Category: 
Spectrometers
Disciplines: 
Experimental nucelar physics, specifically nuclear structure investigations by means of high energy accelerated ions
Life Expectancy: 
20years
Location
Department: 
Physics
Building: 
iThemba Labs
Old Faure Road
Faure
Cape Town
1000

Contact Person/s

Name: Retief Neveling
Phone: +27 21-843-1133
Email: neveling@tlabs.ac.za
Estimated Cost and Availability
Time Spent Researching: 
80
Time Spent Teaching: 
20
Funding Information
Equipment Price: 
R1,830,000
Year of Acquisition: 
2013