Luceo X-Bit Error Rate Test System

Model: 
X-Bit Error Rate Test System
Make: 

The Bit Error Rate Tester is a high speed, low cost modular plug and play BERT equipment, giving the option to configure the device according to customers needs e.g. XFP sensitivity measurements and allow for later upgrade without wasting previous investments.

Category: 
Other
Disciplines: 
Physics, Applied Physics
Location
Nelson Mandela Metropolitan University
University Way
Port Elizabeth
6001

Contact Person/s

Name: Prof Andre Leitch
Phone: +27 41-504-2873
Email: Andrew.Leitch@nmmu.ac.za
Funding Information
Year of Acquisition: 
2007