Luceo X-Bit Error Rate Test System

Model:

X-Bit Error Rate Test System

Manufacturer:

Supplier:

The Bit Error Rate Tester is a high speed, low cost modular plug and play BERT equipment, giving the option to configure the device according to customers needs e.g. XFP sensitivity measurements and allow for later upgrade without wasting previous investments.

Category:

Other

Disciplines:

Physics, Applied Physics

Location

Nelson Mandela Metropolitan University

University Way

Port Elizabeth

6001

Contact Person/s

Name: Prof Andre Leitch
Phone: +27 41-504-2873
Email: Andrew.Leitch@nmmu.ac.za

Funding Information

Year of Acquisition:

2007

Locations

Agricultural Research Council	North West University	University of Johannesburg
Cape Penninsula University of Technology	Oceanographic Research Institute	University of KwaZulu-Natal
Central University of Technology	Rhodes University	University of Limpopo
Centre for Proteomics and Genomics Research	Sefako Makgato Health Sciences University	University of Pretoria
Council for Scientific and Industrial Research (CSIR)	South African Astronomical Observatory	University of South Africa
Durban University of Technology	South African Environmental Observation Network (SAEON)	University of the Free State
Hartebeesthoek Radio Astronomy Observatory (HartRAO)	South African Institute for Aquatic Biodiversity (SAIAB)	University of the Western Cape
iThemba LABS	South African National Space Agency (SANSA)	University of the Witwatersrand
Mintek	South African Nuclear Energy Corporation (NECSA)	University of Venda
National Institute for Communicable Diseases	Stellenbosch University	University of Zululand
National Museum	Tshwane University of Technology	Vaal University of Technology
National Zoological Gardens	University of Cape Town	Walter Sisulu University
Nelson Mandela Metropolitan University	University of Fort Hare

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Luceo X-Bit Error Rate Test System

Contact Person/s

Locations