PANalytical X'Pert PRO X-Ray Diffractometer X-ray Diffractometer (XRD)

X-ray diffraction (XRD) is a versatile, non-destructive technique that reveals detailed information about the chemical composition and crystallographic structure of natural and manufactured materials. The PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for advanced materials science and nanotechnology metrologic characterization in semiconductor process development. It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as rocking curve analysis and reciprocal space mapping; reflectometry and thin film phase analysis; and residual stress and texture analysis.