PANalytical X'Pert PRO X-Ray Diffractometer X-ray Diffractometer (XRD)

Model: 
X'Pert PRO X-Ray Diffractometer
Supplier: 

X-ray diffraction (XRD) is a versatile, non-destructive technique that reveals detailed information about the chemical composition and crystallographic structure of natural and manufactured materials. The PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for advanced materials science and nanotechnology metrologic characterization in semiconductor process development. It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as rocking curve analysis and reciprocal space mapping; reflectometry and thin film phase analysis; and residual stress and texture analysis.

Category: 
Diffractometers - X-ray Diffractometer (XRD)
Location
Department: 
National Centre for Nano-Structured Materials
Building: 
19B Scientia Campus
Meiring Naude Road
Brummeria
Pretoria
0184

Contact Person/s

Name: Margaret Ward
Phone: +27 12-841-3707
Email: mward@csir.co.za