Equipment Filter

Veeco Nanoman V Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

Veeco Nanoman V Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)

The major hardware components of the equipment are the scanner, with a closed (x-y) feed-back loop which provides optimum positioning accurac

Institution: 
iThemba LABS
MicroscopeAtomic Force Microscope (AFM)

Cryogenic Limited (United Kingdom) Physical Properties Measurement System (PPMS) Low Temperature Measurement System: T-1.4 K B-9T Physical Properties Measurement System (PPMS)

The PPMS system allows for the measurement of electrical (electrical conductivity, Hal

Institution: 
iThemba LABS
OtherPhysical Properties Measurement System (PPMS)