Equipment Filter
Carl Zeiss Supra 55 Variable Pressure Field Emission Scanning Electron Microscope (VP FE-SEM) Electron microscope
The Zeiss Supra 55VP FE-SEM is a high resolution state-of-the-art variable pressure field emission scanning electron microscope operating at extrem
Institution:
Sefako Makgato Health Sciences University
Microscope
Zeiss Atomic Force Microscopy with electrochemical capabilities Electron microscope
An atomic force microscope is optimised for measuring surface features that are extremely small in the nanometer scale.
Institution:
Rhodes University
Microscope