Equipment Filter
Leica DM 2500 M Optical Microscope
The Leica DM 2500 M is designed for material analysis and quality control.
Institution:
University of Pretoria
Microscope
Carl Zeiss Ultra Plus Field emission Scanning Electron Microscope (FEGSEM) Electron Microscopes
20 nA FEGSEM with: airlock, STEM, Oxford EDS/EBSD, Quorum Cryo system, charge compensator, plasma cleaner.
Institution:
University of KwaZulu-Natal
Microscope›Electron Microscopes›Scanning Electron Microscope (SEM)