Equipment Filter
Veeco Nanoman V Atomic Force Microscope (AFM) Atomic Force Microscope (AFM)
The major hardware components of the equipment are the scanner, with a closed (x-y) feed-back loop which provides optimum positioning accurac
Institution:
iThemba LABS
Microscope›Atomic Force Microscope (AFM)
Cryogenic Limited (United Kingdom) Physical Properties Measurement System (PPMS) Low Temperature Measurement System: T-1.4 K B-9T Physical Properties Measurement System (PPMS)
The PPMS system allows for the measurement of electrical (electrical conductivity, Hal
Institution:
iThemba LABS
Other›Physical Properties Measurement System (PPMS)